"Customization" in EMC Measuring System

Zhou, L; Deng, LX; Chen, DS; Yan, W

Zhou, L (reprint author), Jiangsu Inst Metrol, 95 E WenLan Rd, Nanjing, Jiangsu, Peoples R China.

2017 ASIA-PACIFIC INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (APEMC), 2017; ( ): 118

Abstract

Three examples shows that with development of electronics technology and information technology, the diversity of test samples brings new challenge to......

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